000			00457nam a2200145Ia 4500
008			211224s9999 xx 000 0 und d
020			_a9780792380795
082			_a621.3950287 SIV
100			_aSivaraman, Mukund
245		2	_aA unified approach for timing verification and delay fault testing
260			_aBoston: _bKluwer Academic, _c1998
300			_axv, 155 p. : ill. ; 25 cm
650			_aDelay faults (Semiconductors)
700			_aStrojwas, Andrzej J
999			_c8550 _d8550