000 00388nam a2200133Ia 4500
008 211224s9999 xx 000 0 und d
020 _a9781856175173
082 _a660 BOW
245 0 _aAtomic force microscopy in process engineering
250 _a1st ed
260 _aAmsterdam:
_bElsevier/Butterworth-Heinemann,
_c2009
300 _axvi, 283 p. : ill
650 _aAtomic force microscopy
999 _c24074
_d24074