| 000 | 00429nam a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 211224s9999 xx 000 0 und d | ||
| 020 | _a9783540434436 | ||
| 082 | _a539 WAS | ||
| 100 | _aWaseda, Yoshio | ||
| 245 | 0 | _aAnomalous x-ray scattering for materials characterization : atomic-scale structure determination | |
| 260 |
_aBerlin: _bSpringer, _c2002 |
||
| 300 | _axiii, 214 p. : ill. ; 24 cm | ||
| 650 | _aX-ray crystallography | ||
| 999 |
_c19680 _d19680 |
||