000			00487nam a2200145Ia 4500
008			211224s9999 xx 000 0 und d
020			_a9780415303972
082			_a620.1124 FIT
100			_aFitzpatrick, M. E
245		0	_aAnalysis of residual stress by diffraction using neutron and synchrotron radiation
260			_aLondon: _bTaylor & Francis, _c2003
300			_axi, 354 p., [4] p. of plates : ill. (some col.) ; 26 cm
650			_aNeutron radiography
700			_aLodini, Alain
999			_c18315 _d18315