000 00445nam a2200145Ia 4500
008 211224s9999 xx 000 0 und d
020 _a9780195140163
082 _a621.3815 BUR
100 _aBurns, Mark
245 3 _aAn introduction to mixed-signal IC test and measurement
260 _aOxford:
_bOxford University Press,
_c2009
300 _axx, 684 p. : ill. ; 25 cm
650 _aIntegrated circuits - Testing
700 _aRoberts, Gordon W
999 _c17664
_d17664