| 000 | 00445nam a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 211224s9999 xx 000 0 und d | ||
| 020 | _a9780819428721 | ||
| 082 | _a620.1 PIC | ||
| 245 | 0 | _aAdvances in optical beam characterization and measurements : 14 July 1998, Québec, Canada | |
| 260 |
_aBellingham, Wash: _bSPIE, _c1998 |
||
| 300 | _av, 128 p. : ill. ; 28 cm | ||
| 650 | _aLaser beams - Measurement - Congresses | ||
| 700 | _aPiché, Michel | ||
| 999 |
_c12261 _d12261 |
||