000 00461nam a2200133Ia 4500
008 211224s9999 xx 000 0 und d
020 _a9780819468529
082 _a681.25 ASS
245 0 _aAdvances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA
260 _aBellingham, Wash:
_bSPIE,
_c2007
300 _a1 v. (various pagings) : ill. ; 28 cm
650 _aLaser interferometers - Congresses
700 _aAssoufid, Lahsen
999 _c12183
_d12183