000 00449nam a2200133Ia 4500
008 211224s9999 xx 000 0 und d
020 _a9780819447081
082 _a621.381 YAO
245 0 _aAdvanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China
260 _aBellingham, Wash:
_bSPIE,
_c2002
300 _axiii, 548 p. : ill. ; 28 cm
650 _aDetectors - Materials - Congresses
700 _aIshii, Yukihiro
999 _c11494
_d11494