| 000 | 00479nam a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 211224s9999 xx 000 0 und d | ||
| 020 | _a9780819450616 | ||
| 082 | _a621.381 DUP | ||
| 245 | 0 | _aAdvanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA | |
| 260 |
_aBellingham, Wash: _bSPIE, _c2003 |
||
| 300 | _ax, 402 p. : ill. ; 28 cm | ||
| 650 | _aNanotechnology - Congresses | ||
| 700 | _aDuparré, Angela | ||
| 999 |
_c11283 _d11283 |
||