| 000 | 00512nam a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 211224s9999 xx 000 0 und d | ||
| 020 | _a9780819445469 | ||
| 082 | _a621.36 DOP | ||
| 245 | 0 | _aAdvanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA | |
| 260 |
_aBellingham, Wash: _bSPIE, _c2002 |
||
| 300 | _aviii, 192 p. : ill. ; 28 cm | ||
| 650 | _aInformation storage and retrieval systems - Congresses | ||
| 700 | _aDuparré, Angela | ||
| 999 |
_c11282 _d11282 |
||