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	1.		Band tailings and deep defects in semiconductors by Teate, A. A Halder, N. C Material type: Text; Format: print ; Literary form: Not fiction Publication details: Switzerland: Scitec Publications, 1996 Availability: No items available. Add to cart (remove)
	2.		Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 by Tomokage, Hajime Material type: Text; Format: print ; Literary form: Not fiction Publication details: Uetikon-Zuerich, Switzerland: Scitec Publications, 2001 Availability: No items available. Add to cart (remove)
	3.		No cover image available No cover image available Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A by Corbett, James W Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York: North-Holland, 1983 Availability: No items available. Add to cart (remove)
	4.		Defects in semiconductors 16 : proceedings of the 16th international conference, Lehigh University, Pennsylvania, 1991 by Davies, Gordon Deleo, Gary. G Material type: Text; Format: print ; Literary form: Not fiction Publication details: Zurich, Switerland: Trans Tech Publications, 1992 Availability: Items available for loan: ACL (1)Call number: 621.38152 DAV. Place hold Add to cart (remove)
	5.		Defects and diffusion in semiconductors : an annual retrospective XI by Fisher, D. J Material type: Text; Format: print ; Literary form: Not fiction Publication details: Switzerland: Trans Tech Publications, 2008 Availability: Items available for loan: ACL (1)Call number: 621.38152 FIS. Place hold Add to cart (remove)
	6.		Defects and diffusion in semiconductors : an annual retrospective X by Fisher, D. J Material type: Text; Format: print ; Literary form: Not fiction Publication details: Switzerland: Trans Tech Publications, 2007 Availability: Items available for loan: ACL (1)Call number: 621.38152 FIS. Place hold Add to cart (remove)
	7.		No cover image available No cover image available Defects and diffusion in semiconductors : an annual retrospective Material type: Text; Format: print ; Literary form: Not fiction Publication details: Uetikon-Zuerich, Switzerland: Scitec Publications, 1998 Availability: No items available. Add to cart (remove)
	8.		Defects and diffusion in II-VI compounds : a 10-year retrospective by Fisher, D. J Material type: Text; Format: print ; Literary form: Not fiction Publication details: Zug, Switzerland: Scitec Publications, 1999 Availability: Items available for loan: ACL (1)Call number: 621.38152 FIS. Place hold Add to cart (remove)
	9.		Defect interaction and clustering in semiconductors by Pizzini, Sergio Material type: Text; Format: print ; Literary form: Not fiction Publication details: Zug, Switzerland: Scitec Publications Ltd, 2002 Availability: Items available for loan: ACL (1)Call number: 537.622 PIZ. Place hold Add to cart (remove)
	10.		No cover image available No cover image available Defects in semiconductors 18 : proceedings of the 18th International Conference on defects in semiconductors by Suezawa, Masashi Katayama-Yoshida, Hiroshi Material type: Text; Format: print ; Literary form: Not fiction Publication details: Switzerland: Trans Tech Publications, 1992 Availability: Items available for loan: ACL (1)Call number: 621.38152 SUE. Place hold Add to cart (remove)

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