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1.
Band tailings and deep defects in semiconductors by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Switzerland: Scitec Publications, 1996
Availability: No items available.

2.
Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Uetikon-Zuerich, Switzerland: Scitec Publications, 2001
Availability: No items available.

3.
Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York: North-Holland, 1983
Availability: No items available.

4.
Defects in semiconductors 16 : proceedings of the 16th international conference, Lehigh University, Pennsylvania, 1991 by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Zurich, Switerland: Trans Tech Publications, 1992
Availability: Items available for loan: ACL (1)Call number: 621.38152 DAV.

5.
Defects and diffusion in semiconductors : an annual retrospective XI by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Switzerland: Trans Tech Publications, 2008
Availability: Items available for loan: ACL (1)Call number: 621.38152 FIS.

6.
Defects and diffusion in semiconductors : an annual retrospective X by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Switzerland: Trans Tech Publications, 2007
Availability: Items available for loan: ACL (1)Call number: 621.38152 FIS.

7.
Defects and diffusion in semiconductors : an annual retrospective
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Uetikon-Zuerich, Switzerland: Scitec Publications, 1998
Availability: No items available.

8.
Defects and diffusion in II-VI compounds : a 10-year retrospective by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Zug, Switzerland: Scitec Publications, 1999
Availability: Items available for loan: ACL (1)Call number: 621.38152 FIS.

9.
Defect interaction and clustering in semiconductors by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Zug, Switzerland: Scitec Publications Ltd, 2002
Availability: Items available for loan: ACL (1)Call number: 537.622 PIZ.

10.
Defects in semiconductors 18 : proceedings of the 18th International Conference on defects in semiconductors by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Switzerland: Trans Tech Publications, 1992
Availability: Items available for loan: ACL (1)Call number: 621.38152 SUE.

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