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	1.		Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 by Tomokage, Hajime Material type: Text; Format: print ; Literary form: Not fiction Publication details: Uetikon-Zuerich, Switzerland: Scitec Publications, 2001 Availability: No items available. Add to cart (remove)
	2.		No cover image available No cover image available Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A by Corbett, James W Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York: North-Holland, 1983 Availability: No items available. Add to cart (remove)
	3.		Defects in semiconductors 16 : proceedings of the 16th international conference, Lehigh University, Pennsylvania, 1991 by Davies, Gordon Deleo, Gary. G Material type: Text; Format: print ; Literary form: Not fiction Publication details: Zurich, Switerland: Trans Tech Publications, 1992 Availability: Items available for loan: ACL (1)Call number: 621.38152 DAV. Place hold Add to cart (remove)
	4.		No cover image available No cover image available Defects in semiconductors 18 : proceedings of the 18th International Conference on defects in semiconductors by Suezawa, Masashi Katayama-Yoshida, Hiroshi Material type: Text; Format: print ; Literary form: Not fiction Publication details: Switzerland: Trans Tech Publications, 1992 Availability: Items available for loan: ACL (1)Call number: 621.38152 SUE. Place hold Add to cart (remove)

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