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1.
Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, Wash: SPIE, 2007
Availability: No items available.

2.
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, Wash: SPIE, 2003
Availability: No items available.

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Chemical physics of thin film deposition processes for micro- and nano-technologies by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Dordrecht ; Boston: Kluwer Academic Publishers, 2002
Availability: Items available for loan: ACL (1)Call number: 621.38152 PAU.

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