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1.
Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, Wash: SPIE, 2007
Availability: No items available.

2.
Advances in metrology for x-ray and EUV optics : 2-3 August, 2005, San Diego, California, USA by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, Wash: SPIE, 2005
Availability: No items available.

3.
Eighth international symposium on laser metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, WA: SPIE, 2005
Availability: Items available for loan: ACL (1)Call number: 621.366 VER.

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