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1.
A unified approach for timing verification and delay fault testing by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Boston: Kluwer Academic, 1998
Availability: No items available.

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2.
Delay fault testing for VLSI circuits by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Dordrecht ; Boston: Kluwer Academic Publishers, 1998
Availability: Items available for loan: ACL (1)Call number: 621.381548 KRS.

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