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1.
Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, Wash: SPIE, 2007
Availability: No items available.

2.
Advances in metrology for x-ray and EUV optics : 2-3 August, 2005, San Diego, California, USA by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, Wash: SPIE, 2005
Availability: No items available.

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