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Atom-probe field ion microscopy : field ion emission, and surfaces and interfaces at atomic resolution

By: Material type: TextTextPublication details: Cambridge: Cambridge Univeristy Press, 2005Edition: 1st edDescription: x, 387 p. : ill. ; 24 cmISBN:
  • 9780521019934
Subject(s): DDC classification:
  • 502.82 TSO
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