Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000

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TextPublication details: Uetikon-Zuerich, Switzerland: Scitec Publications, 2001Description: xiii, 441 p. : ill. ; 25 cmISBN:

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