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Analog signal generation for built-in-self-test of mixed-signal integrated circuits

By: Contributor(s): Material type: TextTextPublication details: Boston: Kluwer Academic Publishers, 1995Description: viii, 122 p. : ill. ; 25 cmISBN:
  • 9780792395645
Subject(s): DDC classification:
  • 621.381548 ROB
Item type:
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