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1.
Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, Wash: SPIE, 2007
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Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, Wash: SPIE, 2003
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3.
Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bellingham, Wash: SPIE, 2002
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