TY  - BOOK
AU  - Sivaraman, Mukund
AU  - Strojwas, Andrzej J
TI  - A unified approach for timing verification and delay fault testing
SN  - 9780792380795
U1  - 621.3950287 SIV 
PY  - 1998///
CY  - Boston
PB  - Kluwer Academic
KW  - Delay faults (Semiconductors)
ER  -