Sivaraman, Mukund <br/><br/>
A unified approach for timing verification and delay fault testing 

 - Boston:  Kluwer Academic,  1998 
 - xv, 155 p. : ill. ; 25 cm 
<br/><br/><label>ISBN: </label>9780792380795 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Delay faults (Semiconductors)
<br/><br/><label>Dewey Class. No.: </label>621.3950287 SIV