Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 

 - Uetikon-Zuerich, Switzerland:  Scitec Publications,  2001 
 - xiii, 441 p. : ill. ; 25 cm 
<br/><br/><label>ISBN: </label>9783908450610 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors - Defects - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.38152 TOM