Beam effects, surface topography, and depth profiling in surface analysis 

 - New York:  Plenum Press,  1998 
 - xix, 430 p. : ill. ; 24 cm. 
<br/><br/><label>ISBN: </label>9780306458965 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials - Effect of radiation on
<br/><br/><label>Dewey Class. No.: </label>620.44 CZA