Maier, Phillip Q <br/><br/>
Audit and trace log management: consolidation and analysis 

 - Boca Raton, FL:  Auerbach Publications,  2005 
 - xiii, 171 p. : ill 
<br/><br/><label>ISBN: </label>849327253 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer science
<br/><br/><label>Dewey Class. No.: </label>005.8 MAI