Tsong, Tien Tzou Atom-probe field ion microscopy : field ion emission, and surfaces and interfaces at atomic resolution - 1st ed - Cambridge: Cambridge Univeristy Press, 2005 - x, 387 p. : ill. ; 24 cm ISBN: 9780521019934 Subjects--Topical Terms: Atom-probe field ion microscopy Dewey Class. No.: 502.82 TSO