Atomic force microscopy/scanning tunneling microscopy 2 

 - New York:  Plenum Press,  1997 
 - ix, 250 p. : ill. ; 26 cm 
<br/><br/><label>ISBN: </label>9780306455964 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy
<br/><br/><label>Dewey Class. No.: </label>502.82 COH