Atomic force microscopy/scanning tunneling microscopy 

 - New York:  Plenum Press,  1994 
 - x, 453 p. : ill. ; 26 cm 
<br/><br/><label>ISBN: </label>9780306448904 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy
<br/><br/><label>Dewey Class. No.: </label>502.82 COH