Atomic force microscopy in process engineering 

 - 1st ed 
 - Amsterdam:  Elsevier/Butterworth-Heinemann,  2009 
 - xvi, 283 p. : ill 
<br/><br/><label>ISBN: </label>9781856175173 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy
<br/><br/><label>Dewey Class. No.: </label>660 BOW