Bhushan, Bharat <br/><br/>
Applied scanning probe methods 

 - New York:  Springer,  2004 
 - xx, 496 p. : ill. ; 24 cm 
<br/><br/><label>ISBN: </label>9783540005278 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials - Microscopy
<br/><br/><label>Dewey Class. No.: </label>620.11299 BHU