Perry, Douglas L <br/><br/>
Applied formal verification 

 - New York:  McGraw Hill,  2005 
 - xiv, 237 p. : ill. ; 24 cm 
<br/><br/><label>ISBN: </label>9780071443722 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic circuits - Testing
<br/><br/><label>Dewey Class. No.: </label>621.3815 PER