Waseda, Yoshio <br/><br/>
Anomalous x-ray scattering for materials characterization : atomic-scale structure determination 

 - Berlin:  Springer,  2002 
 - xiii, 214 p. : ill. ; 24 cm 
<br/><br/><label>ISBN: </label>9783540434436 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-ray crystallography
<br/><br/><label>Dewey Class. No.: </label>539 WAS