Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard 

 - Boston:  Kluwer Academic Publishers,  1999 
 - xviii, 155 p. : ill. ; 24 cm 
<br/><br/><label>ISBN: </label>9780792386865 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Boundary scan testing
<br/><br/><label>Dewey Class. No.: </label>621.381548 OSS