Advances in optical beam characterization and measurements : 14 July 1998, Québec, Canada 

 - Bellingham, Wash:  SPIE,  1998 
 - v, 128 p. : ill. ; 28 cm 
<br/><br/><label>ISBN: </label>9780819428721 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Laser beams - Measurement - Congresses
<br/><br/><label>Dewey Class. No.: </label>620.1 PIC