Advanced microscopy techniques : 14-16 June 2009, Munich, Germany 

 - Bellingham, Wash. ; Washington, D.C:  OSA, SPIE,  2009 
 - 1 v. (various pagings) : ill. ; 28 cm 
<br/><br/><label>ISBN: </label>9780819476432 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy - methods - Congresses
<br/><br/><label>Dewey Class. No.: </label>610.284 CAM