Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China 

 - Bellingham, Wash:  SPIE,  2002 
 - xiii, 548 p. : ill. ; 28 cm 
<br/><br/><label>ISBN: </label>9780819447081 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Detectors - Materials - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.381 YAO