TY  - BOOK
AU  - Duparré, Angela
TI  - Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA
SN  - 9780819468208
U1  - 621.381045 DUP 
PY  - 2007///
CY  - Bellingham, Wash
PB  - SPIE
KW  - Nanotechnology - Congresses
ER  -