Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA 

 - Bellingham, Wash:  SPIE,  2003 
 - x, 402 p. : ill. ; 28 cm 
<br/><br/><label>ISBN: </label>9780819450616 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanotechnology - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.381 DUP