TY  - BOOK
AU  - Duparré, Angela
TI  - Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA
SN  - 9780819445469
U1  - 621.36 DOP 
PY  - 2002///
CY  - Bellingham, Wash
PB  - SPIE
KW  - Information storage and retrieval systems - Congresses
ER  -