Amazon cover image
Image from Amazon.com
Image from Google Jackets

Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA

Contributor(s): Material type: TextTextPublication details: Bellingham, Wash: SPIE, 2007Description: 1 v. (various pagings) : ill. ; 28 cmISBN:
  • 9780819468529
Subject(s): DDC classification:
  • 681.25 ASS
Item type:
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

There are no comments on this title.

to post a comment.

Powered by Koha