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Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA

Contributor(s): Material type: TextTextPublication details: Bellingham, Wash: SPIE, 2007Description: 1 v. (various pagings) : ill. ; 28 cmISBN:
  • 9780819468208
Subject(s): DDC classification:
  • 621.381045 DUP
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