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Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA

Contributor(s): Material type: TextTextPublication details: Bellingham, Wash: SPIE, 2003Description: x, 402 p. : ill. ; 28 cmISBN:
  • 9780819450616
Subject(s): DDC classification:
  • 621.381 DUP
Item type:
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