Amazon cover image
Image from Amazon.com
Image from Google Jackets

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA

Contributor(s): Material type: TextTextPublication details: Bellingham, Wash: SPIE, 2002Description: viii, 192 p. : ill. ; 28 cmISBN:
  • 9780819445469
Subject(s): DDC classification:
  • 621.36 DOP
Item type:
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

There are no comments on this title.

to post a comment.

Powered by Koha