Advanced electron microscopy and nanomaterials : selected, peer reviewed papers from the first joint advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT '09), Saltillo (Coahuila) México, September 29th-October 2nd, 2009 (Record no. 11358)
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fixed length control field | 00662nam a2200133Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 211224s9999 xx 000 0 und d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780878492817 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 620.1129 PON |
245 #0 - TITLE STATEMENT | |
Title | Advanced electron microscopy and nanomaterials : selected, peer reviewed papers from the first joint advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT '09), Saltillo (Coahuila) México, September 29th-October 2nd, 2009 |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | Stafa-Zurich, Switzerland ; Enfield, NH: |
Name of publisher, distributor, etc. | Trans Tech Publications, |
Date of publication, distribution, etc. | 2010 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | x, 142 p. : ill. ; 25 cm |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Electron microscopy - Congresses |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Bueno, Darío |
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