A unified approach for timing verification and delay fault testing
Sivaraman, Mukund
A unified approach for timing verification and delay fault testing - Boston: Kluwer Academic, 1998 - xv, 155 p. : ill. ; 25 cm
9780792380795
Delay faults (Semiconductors)
621.3950287 SIV
A unified approach for timing verification and delay fault testing - Boston: Kluwer Academic, 1998 - xv, 155 p. : ill. ; 25 cm
9780792380795
Delay faults (Semiconductors)
621.3950287 SIV