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Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000

Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 - Uetikon-Zuerich, Switzerland: Scitec Publications, 2001 - xiii, 441 p. : ill. ; 25 cm

ISBN: 9783908450610

Subjects--Topical Terms:
Semiconductors - Defects - Congresses

Dewey Class. No.: 621.38152 TOM

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