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Beam effects, surface topography, and depth profiling in surface analysis

Beam effects, surface topography, and depth profiling in surface analysis - New York: Plenum Press, 1998 - xix, 430 p. : ill. ; 24 cm.

ISBN: 9780306458965

Subjects--Topical Terms:
Materials - Effect of radiation on

Dewey Class. No.: 620.44 CZA

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