Normal view MARC view ISBD view

Atom-probe field ion microscopy : field ion emission, and surfaces and interfaces at atomic resolution

Tsong, Tien Tzou

Atom-probe field ion microscopy : field ion emission, and surfaces and interfaces at atomic resolution - 1st ed - Cambridge: Cambridge Univeristy Press, 2005 - x, 387 p. : ill. ; 24 cm

ISBN: 9780521019934

Subjects--Topical Terms:
Atom-probe field ion microscopy

Dewey Class. No.: 502.82 TSO

Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)