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Atomic force microscopy/scanning tunneling microscopy 2

Atomic force microscopy/scanning tunneling microscopy 2 - New York: Plenum Press, 1997 - ix, 250 p. : ill. ; 26 cm

ISBN: 9780306455964

Subjects--Topical Terms:
Atomic force microscopy

Dewey Class. No.: 502.82 COH

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