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Anomalous x-ray scattering for materials characterization : atomic-scale structure determination

Waseda, Yoshio

Anomalous x-ray scattering for materials characterization : atomic-scale structure determination - Berlin: Springer, 2002 - xiii, 214 p. : ill. ; 24 cm

ISBN: 9783540434436

Subjects--Topical Terms:
X-ray crystallography

Dewey Class. No.: 539 WAS

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